Presenter

Dr. Yi-Shing Chang received the Ph.D. degree from Dept. of EE-Systems, University of Southern California, Los Angeles, CA, USA, in 2001. He joined Design and Test Technology (DT), Intel, at Folsom, CA, upon graduation in 2001. He was involved in developing various deep sub-micron noise testing solutions including crosstalk and power supply noise, and defect based testing methodologies including delay, transition, and logic proximity bridge faults for Microprocessors and SOC. From 2005 to 2009, he worked on test selection, scan-out selection, CPU diagnosis, and test program offline validation. A full software suite was developed for test program offline validation and enabled virtual device under test (vDUT) offline simulation for SOC and CPU to catch test program bugs without running thousands of devices on the testers. From 2010 to 2013, he led the developing of tester runtime library for in-house testers and it gained project of record (POR) for companywide SOC projects. In 2014, he transferred to Silicon Photonics Product Division, DCG, responsible for production test solutions. He is a Principal Engineer in the same division responsible for all software development, test automation, and database analytics solutions. His research interests include big data system for high volume production, machine learning for manufacturing, and optical transceiver and interconnect system. He has authored or co-authored more than 20 papers in peer reviewed internal and international conferences and journals. One of his co-authored paper won the prestigious Best Paper Award of IEEE Computer Society Technical Committee on VLSI in 2018. He was a SRC mentor and served as a technical program committee member for ATS from 2013 to 2015 and ICCD from 2014 to 2018.